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Influence of the front contact barrier height on the Indium Tin Oxide/hydrogenated p-doped amorphous silicon heterojunction solar cells


Abstract
The band bending at the transparent conductive oxides/hydrogenated p-doped amorphous silicon (p-a-Si:H) interface is one of the most
important factors limiting the performances of HIT (Heterojunctions with Intrinsic Thin layers) solar cells. In order to study this effect, a solar cell
(Indium Tin Oxide (ITO)/p-a-Si:H/i-polymorphous Si:H/n-doped crystalline silicon (n-c-Si)) simulation, focused on the front contact barrier
height, has been performed. The results show that a reduction of the surface potential barrier at the interface ITO/p-layer leads to an increase of the
built-in potential, and hence an increase of open circuit voltage and fill factor. We have also observed that the performance of HIT solar cells
remains constant above 12nm thickness of the p-layer.
© 2008 Elsevier B.V. All rights reserved.